Date 2020


The 23rd DATE conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems. DATE puts a strong emphasis on both technology and systems, covering ICs/ SoCs, reconfigurable hardware and embedded systems, and embedded software.

The five-day event consists of a conference with plenary invited papers, regular papers, panels, hot-topic sessions, tutorials and workshops, two special focus days and a track for executives. The scientific conference is complemented by a commercial exhibition showing the state-of-the-art in design and test tools, methodologies, IP and design services, reconfigurable and other hardware platforms, embedded software, and (industrial) design experiences from different application domains, e.g. automotive, IoT, wireless, telecom and multimedia applications. The organisation of user group meetings, fringe meetings, a university booth, a PhD forum, vendor presentations and social events offers a wide variety of extra opportunities to meet and exchange information on relevant issues for the design and test community. Special space will also be allocated for EU-funded projects to show their results.

Zuken at Date2020

Quick decision of System In Package implementation for IoT/5G era
Tuesday, March 10 – 18:00 – 18:30

During the conference Zuken’s Iyad Rayane will hold a presentation which will focus on how the increasing complexity of system on chips (SoCs) combined with a new generation of designs that combine multiple chips in a single package (Sip) is creating new challenges in the design of IC packages, printed circuit boards (PCBs) and integrated circuits (ICs). This challenge is being addressed by a new integrated 3D chip/package/board co-design environment that makes it possible to take quick decision of the best SiP implementation by considering the system-level impact of each design decision, especially for optimizing. The new co-design approach enables netlist management to follow up design modification including die partitioning and seamless electrical characteristic verification during the design. The end result is higher performance and improved quality for smart systems, MEMS and IoT applications